Advanced atomic force microscopy techniques
نویسندگان
چکیده
منابع مشابه
Advanced atomic force microscopy techniques
Address: 1Department of Physics, University of Basel, Klingelbergstr. 82, 4056 Basel, Switzerland, 2Institute of Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), Campus North, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein Leopoldshafen, Germany, 3Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76021 Karlsruhe, Germany, 4Department of Mechan...
متن کاملAdvanced atomic force microscopy techniques III
Atomic force microscopy (AFM) celebrates its 30th anniversary this year. It was presented by Binnig, Quate and Gerber in 1986 as an extension of the scanning tunneling microscope (STM) with the possibility to measure forces as small as 10−18 N [1]. Since then many different variations of the force detection method and various applications have appeared [2,3] and still the scientific community i...
متن کاملAdvanced atomic force microscopy techniques II
Surface science and nanotechnology are inherently coupled because of the increased surface-to-volume ratio at the nanometer scale. Most of the exciting and astonishing properties of nanoscale materials are related to certain surface reconstructions and nanoscale geometries. New functionality is achieved by combinations of nanoscale materials or by structuring their surfaces. The unrivaled tools...
متن کاملAtomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملAdvanced Atomic Force Microscopy: Exploring Measurements of Local Electric Properties
Introduction In the past two decades Atomic Force Microscopy (AFM) has been recognized as a powerful characterization method of surfaces at small scales and in different environments. In addition to high-resolution visualization of surface morphology and nanoscale structures, AFM microscopes are also broadly applied for examination of mechanical, electromagnetic, optical and other properties. T...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2012
ISSN: 2190-4286
DOI: 10.3762/bjnano.3.99